SN74LVTH18646APM Mode
Espesifikasyon pou SN74LVTH18646APM
Nimewo pati : SN74LVTH18646APM
Fabricant : Texas Instruments
Deskripsyon : IC SCAN-TEST-DEV/XCVR 64-LQFP
Seri : 74LVTH
Estati Pati : Active
Tip lojik : ABT Scan Test Device With Transceivers and Registers
Pwovizyon pou Voltage : 2.7V ~ 3.6V
Kantite Bits : 18
Operating Tanperati : -40°C ~ 85°C
Mounting Kalite : Surface Mount
Pake / Ka : 64-LQFP
Pake Aparèy Founisè : 64-LQFP (10x10)
Pwa : -
kondisyon : Nouvo ak orijinal
Kalite Garanti : 365 jou garanti
stock Resous : Franchize Distribitè / Fabricant Dirèk
PEYI KOTE L SOTI : USA / TAIWAN / MEXICO / MALAYSIA / PHI
Fabricant Nimewo Pati
Entèn Nimewo Pati
Fabricant
Kout Deskripsyon
IC SCAN-TEST-DEV/XCVR 64-LQFP
RoHS Ki dènye nouvèl
Plon gratis / RoHS Konfòm
akouchman Tan
1-2 jou
Disponib Kantite
40810 moso
referans pri
pri nou
- (Tanpri kontakte nou pou yon pri pi bon: [email protected])
- AXE Semiconductor gen SN74LVTH18646APM nan stock pou vann.
- D 'opsyon ak anbake tan:
- DHL: 2-3 days.
- FEDEX: 2-3 days.
- UPS: 2-4 days.
- TNT: 3-5 days.
- EMS: 5-8 days.
- Normal Post: 10-15 days.
- Posiblite peman:
- Paypal (Credit Card)
- Bank Transfer (Wire Transfer)
- Western Union
- MoneyGram
pwodwi ki gen rapò pou SN74LVTH18646APM Texas Instruments
| Nimewo pati | mak | Deskripsyon | Achte |
|---|---|---|---|
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