SN74ABT8952DWR Mode

Espesifikasyon pou SN74ABT8952DWR

Nimewo pati : SN74ABT8952DWR
Fabricant : Texas Instruments
Deskripsyon : IC SCAN TEST DEVICE 28SOIC
Seri : 74ABT
Estati Pati : Obsolete
Tip lojik : Scan Test Device with Registered Bus Transceiver
Pwovizyon pou Voltage : 4.5V ~ 5.5V
Kantite Bits : 8
Operating Tanperati : -40°C ~ 85°C
Mounting Kalite : Surface Mount
Pake / Ka : 28-SOIC (0.295", 7.50mm Width)
Pake Aparèy Founisè : 28-SOIC
Pwa : -
kondisyon : Nouvo ak orijinal
Kalite Garanti : 365 jou garanti
stock Resous : Franchize Distribitè / Fabricant Dirèk
PEYI KOTE L SOTI : USA / TAIWAN / MEXICO / MALAYSIA / PHI
Fabricant Nimewo Pati
SN74ABT8952DWR
Entèn Nimewo Pati
AX-SN74ABT8952DWR
Fabricant
Texas Instruments
Kout Deskripsyon
IC SCAN TEST DEVICE 28SOIC
RoHS Ki dènye nouvèl
Plon gratis / RoHS Konfòm
akouchman Tan
1-2 jou
Disponib Kantite
54240 moso
referans pri
USD 0
pri nou
- (Tanpri kontakte nou pou yon pri pi bon: [email protected])
AXE Semiconductor gen SN74ABT8952DWR nan stock pou vann.
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pwodwi ki gen rapò pou SN74ABT8952DWR Texas Instruments

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