SN74ABT18646PM Mode

Espesifikasyon pou SN74ABT18646PM

Nimewo pati : SN74ABT18646PM
Fabricant : Texas Instruments
Deskripsyon : IC SCAN-TEST-DEV/TXRX 64-LQFP
Seri : 74ABT
Estati Pati : Active
Tip lojik : Scan Test Device With Transceivers And Registers
Pwovizyon pou Voltage : 4.5V ~ 5.5V
Kantite Bits : 18
Operating Tanperati : -40°C ~ 85°C
Mounting Kalite : Surface Mount
Pake / Ka : 64-LQFP
Pake Aparèy Founisè : 64-LQFP (10x10)
Pwa : -
kondisyon : Nouvo ak orijinal
Kalite Garanti : 365 jou garanti
stock Resous : Franchize Distribitè / Fabricant Dirèk
PEYI KOTE L SOTI : USA / TAIWAN / MEXICO / MALAYSIA / PHI
Fabricant Nimewo Pati
SN74ABT18646PM
Entèn Nimewo Pati
AX-SN74ABT18646PM
Fabricant
Texas Instruments
Kout Deskripsyon
IC SCAN-TEST-DEV/TXRX 64-LQFP
RoHS Ki dènye nouvèl
Plon gratis / RoHS Konfòm
akouchman Tan
1-2 jou
Disponib Kantite
36589 moso
referans pri
USD 0
pri nou
- (Tanpri kontakte nou pou yon pri pi bon: [email protected])
AXE Semiconductor gen SN74ABT18646PM nan stock pou vann.
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UPS: 2-4 days.
TNT: 3-5 days.
EMS: 5-8 days.
Normal Post: 10-15 days.
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pwodwi ki gen rapò pou SN74ABT18646PM Texas Instruments

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